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Presenting at CAD’22

We are delighted to announce that the DMF lab will be attending and presenting research the 19th annual International CAD Conference. The conference brings together researchers and practitioners from across the world together to discuss and share knowledge and advances in Computer Aided Design.

Papers to be presented are:

Sensitivity Analysis of the Digital Thread

Chris Cox, Ben Hopper, Ben Hicks, and James Gopsill

The Digital Transformation of engineering practice is accelerating opportunities for integration and automation. Application Programming Interfaces (APIs) and command line interfaces permits the chaining of tools in an input-task-output fashion resulting in toolchains that can automate the construction and execution of models that describe, for example, a products cost, ergonomics, performance, and manufacturability. Such capability is hugely beneficial but gives rise to challenges concerning the configuration, co-ordination, and assessing the computational effort expended, herein termed the Digital Thread.

To shed some light on the sensitivity of the Digital Thread, this paper explores the uncertainty around the generation and exchange of Standard Tessellation Language (STL) files along CAD/CAM toolchains. The results show variance exists in the exported geometry and this variance could lead to design uncertainty with inaccurate simulation results and manufacturing profiles and, in extreme cases, solutions not being resolved. Additionally, computational effort can easily be expended without additional insight being produced by the thread. Thus, industry and research need to be aware, record and evaluate the sensitivity of their workflows in order to support the assessment of their outputs and compute sustainably

CAD Refactoring and the Art of Computer Aided Design Model Maintenance

Peter Rosso, James Gopsill, Stuart Burgess, and Ben Hicks

We look forward to seeing you there. If you are unable to make it and are interested in any of our papers then feel free to get in touch to learn more.

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